Volume 12, Number 09, May 2022

Intelligent Unit Level Test Generator for Enhanced Software Quality

  Authors

Ning Luo and Linlin Zhang, Intel Asia-Pacific Research & Development Ltd, China

  Abstract

Unit level test has been widely recognized as an important approach to improving software quality, as it can expose bugs earlier during the development phase. However, manual unit level test development is often tedious and insufficient. Also, it is hard for developers to precisely identify the most error prone code block deserving the best test coverage by themselves. In this paper, we present the automatic Unit level test framework we used for intel media driver development. It can help us identify the most critical code block, provide the test coverage recommendation, and automatically generate >80% ULT code (~400K Lines of test code) as well as ~35% test cases (~7K test cases) for intel media driver. It helps us to greatly shrink the average ULT development effort from ~24 Man hours to ~3 Man hours per 1000 Lines of driver source code.

  Keywords

Unit level test, error prone logic, test coverage inference, automatic ULT generation, fuzzing, condition/decision coverage.